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Títol: How knowledge map fit and personalization affect success of KMS in high-tech firms
Autor: Lai JY (Lai Jung-Yu)1 Wang CT (Wang Chao-Te)1 Chou CY (Chou Chun-Yi)1
Referència: TECHNOVATION
Volum: 29 issue: 4
Pàgines: 313-324
Any: 2009
Codi ISBN/ISSN: 0166-4972
Tipus de document: Article
Paraules clau: Science park, Effectiveness; IS success; Knowledge management systems (KMS); Knowledge map fit; Personalization; User satisfaction
Idioma: Anglès
Resum: The shift from it product-based to a knowledge-based economy has resulted in all increasing demand for organizations to implement knowledge management systems (KMS) at in accelerating pace. However, factors influencing success of KMS have seldom been empirically examined by prior research, particularly how knowledge map fit and personalization influence employee satisfaction with KMS, which is it surrogate measure of the success/effectiveness of information systems (IS). Results from a sample of 133 employees, mostly from four international high-tech companies in the Hsin-Chu Science-based Industrial Park in Taiwan, help us better understand what factors affect employee satisfaction with KMS. The result shows that KMS with a higher level of knowledge map fit and personalization will satisfy employees directly or indirectly through the mediation effects of increased perceptions of case of use and usefulness of KMS. Our findings could serve as useful references for researchers and practitioners interested in investigating issues related to the successful implementation of KMS.
Adreça: Natl Chung Hsing Univ, Inst Management Technol, Taichung 402, Taiwan E-mail Addresses: jylai@nchu.edu.tw